In today's rapidly evolving global market, electronic products must meet stringent international regulatory requirements for emissions and immunity. This is especially crucial for products sold in Europe and an increasing number of countries in Asia. The California Instruments CTSHL System offers a cost-effective solution for verifying high power product compliance with various AC/DC-harmonized test standards. Building on the proven capabilities of the California Instruments CTS Series, the CTSHL system is trusted by EMC labs worldwide for its reliability and advanced features.
Supported Test Standards
| Supported Version |
Title | Edition |
| IEC 61000-3-2:2018+AMD1:2020 CSV | Limits for harmonic current emissions (equipment ≤16 A per phase) | 5.1 |
| IEC 61000-3-3:2013+AMD1:2017+AMD2: 2021 CSV | Limitation of voltage changes, voltage fluctuations and flicker (equipment ≤16 A per phase) | 3.2 |
| IEC 61000-3-11:2017 RLV | Limitation of voltage changes, voltage fluctuations and flicker (equipment ≤75 A per phase) | 2.0 |
| IEC 61000-3-12:2011+AMD1:2021 CSV |
Limits for harmonic current emissions (equipment ≤16 A per phase) | 2.1 |
| IEC 61000-4-11:2020 RLV [1] | Voltage dips, short interruptions and voltage variations immunity tests (equipment ≤16 A per phase) | 3.0 |
| IEC 61000-4-13:2002+AMD1:2009+AMD2: 2015 CSV | Harmonics and interharmonics including mains signalling at a.c. power port, low frequency immunity tests | 1.2 |
| IEC 61000-4-14:1999+AMD1:2001+AMD2: 2009 CSV |
Voltage fluctuation immunity test for equipment with input current not exceeding 16 A per phase |
1.2 |
| IEC 61000-4-17:1999+AMD1:2001+AMD2: 2008 CSV | Ripple on d.c. input power port immunity test | 1.2 |
| IEC 61000-4-28:1999+AMD1:2001+AMD2: 2009 CSV | Variation of power frequency, immunity test for equipment with input current not exceeding 16 A per phase | 1.2 |
| IEC 61000-4-29:2000 [1] | Voltage dips, short interruptions and voltage variations on d.c. input power port immunity tests |
1.0 |
| Note [1]: Pre-compliance |
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Key Features of the CTSHL Series
- The Direct PC bus access data acquisition system provides the required sampling rate and resolution to meet IEC 61000-4-7 measurement requirements and supports high-speed data transfers.
- PC-based Harmonic and Flicker test software provides real-time full-color data display updates and continuous PASS/FAIL monitoring.
- Automatic calculation of the maximum permissible system impedance Zsys, using the Zref and measured Flicker parameters, as required per EN/IEC 61000-3-11.
- Intuitive operating software provides IEC test setup, data analysis, display, with test reports in and MS Word format.
- High resolution, no gap acquisition data storage to ensure that all data can be streamed to disk (in ASCII format if needed) for later review and replay of the actual test.
- Single Step and Fast playback mode of test results.
